The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 09, 2025
Filed:
Mar. 29, 2023
Nidek Co., Ltd., Gamagori, JP;
Naoki Takeno, Aichi, JP;
Yasuhiro Furuuchi, Aichi, JP;
Shinya Mito, Aichi, JP;
Kouji Hamaguchi, Aichi, JP;
NIDEK CO., LTD., Aichi, JP;
Abstract
An ophthalmic system for examining a subject eye of an examinee includes a plurality of examination units, a robot mechanism, and a controller. The plurality of examination units have housings different from each other, perform examinations different from each other, and include at least a first examination unit and a second examination unit. The robot mechanism has a holding unit that holds and releases either the first examination unit or the second examination unit, and a moving unit that is connected to the holding unit and moves three-dimensionally. A controller controls driving of the robot mechanism to adjust a relative positional relationship between the subject eye and the first examination unit or the second examination unit held by the holding unit. The first examination unit or the second examination unit is replaced to be held by the holding unit for performing a different examination on the subject eye.