The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Sep. 25, 2022
Applicant:

Mediatek Inc., Hsin-Chu, TW;

Inventors:

Hsuan-Li Lin, Hsin-Chu, TW;

Tsang-Wei Yu, Hsin-Chu, TW;

Assignee:

MediaTek Inc., Hsinchu, TW;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 36/08 (2009.01); H04W 36/00 (2009.01); H04W 56/00 (2009.01);
U.S. Cl.
CPC ...
H04W 36/0085 (2018.08); H04W 36/0058 (2018.08); H04W 36/083 (2023.05); H04W 56/001 (2013.01);
Abstract

A method of determining the maximum timing change (MTC) based on subcarrier spacing (SCS) configuration for UE measurement and reporting of a neighbor cell in 5 GS is proposed. During measurement procedure, UE first checks whether a neighbor cell has been detectable at least for the time period T, and becomes undetectable for a period ≤5 seconds, and then the cell becomes detectable again. UE then determines the MTC of the cell according to the SCS configuration of the cell. If the timing change of the cell is <MTC, UE reports the measurement report less than a first period (T) after the measurement event is triggered. Otherwise, if the timing change of the cell is >MTC, UE reports the event triggered measurement reporting less than a second period (T) after the measurement event is triggered.


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