The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Sep. 06, 2022
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Shunsuke Sakurai, Kawasaki, JP;

Masako Kashiwagi, Kawasaki, JP;

Akihito Seki, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/60 (2023.01); G06T 7/50 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
H04N 23/64 (2023.01); G06T 7/50 (2017.01); G06T 7/60 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30168 (2013.01);
Abstract

According to one embodiment, an image processing device is used when measuring a capture distance from a capture device to a subject in an image using an image captured by the capture device and affected by aberration of an optical system of the capture device. The image processing device includes a processor. The processor is configured to acquire an image captured by the capture device, acquire configuration information relating to an optical system of the capture device, acquire a capture distance with respect to the image based on the acquired image, create a first capture condition of an image suitable for measuring a distance to the subject based on the acquired configuration information and the acquired capture distance, and output the created first capture condition.


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