The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jan. 30, 2024
Applicant:

Huawei Technologies Co., Ltd., Guangdong, CN;

Inventors:

Alexey Konstantinovich Filippov, Moscow, RU;

Vasily Alexeevich Rufitskiy, Moscow, RU;

Jianle Chen, San Diego, CA (US);

Xiang Ma, Moscow, RU;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/94 (2006.01); H04N 19/105 (2014.01); H04N 19/167 (2014.01); H04N 19/176 (2014.01); H04N 19/186 (2014.01); H04N 19/593 (2014.01);
U.S. Cl.
CPC ...
H04N 19/593 (2014.11); H04N 19/105 (2014.11); H04N 19/167 (2014.11); H04N 19/176 (2014.11); H04N 19/186 (2014.11);
Abstract

Apparatuses and methods for encoding and decoding are provided. The method for intra predicting a chroma sample of a block by applying cross-component linear model includes: obtaining reconstructed luma samples; determining maximum and minimum luma sample values based on the reconstructed luma samples; obtaining a difference of the maximum and minimum luma sample values. The method also includes: fetching a value out of a lookup table (LUT) by using a set of bits as an index, the set of bits following a position of the most-significant bit; obtaining linear model parameters based on the fetched value; and calculating a predicted chroma sample value by using the obtained linear model parameters. The efficiency to fetch the value out of the LUT is increased.


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