The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Oct. 22, 2020
Apple Inc., Cupertino, CA (US);
Yushu Zhang, Beijing, CN;
Wei Zeng, San Diego, CA (US);
Dawei Zhang, Saratoga, CA (US);
Haijing Hu, Beijing, CN;
Haitong Sun, Irvine, CA (US);
Weidong Yang, San Diego, CA (US);
Yuchul Kim, Santa Clara, CA (US);
Hong He, Cupertino, CA (US);
Oghenekome Oteri, San Diego, CA (US);
Chunxuan Ye, San Diego, CA (US);
Chunhai Yao, Beijing, CN;
Jie Cui, San Jose, CA (US);
Yang Tang, Cupertino, CA (US);
Yakun Sun, San Jose, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Embodiments are presented herein of apparatuses, systems, and methods for a user equipment device (UE) to perform beam failure detection. The UE may establish communication with a base station. The UE may determine one or more beams to perform downlink communication from the base station. The UE may receive, from the base station, an indication of a first type of downlink reference signals to perform beam failure detection. The UE may perform signal quality measurements for the one or more beams using the first type of downlink reference signals. The UE may determine beam failure of at least one beam of the one or more beams based on said performing signal quality measurements.