The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Mar. 12, 2024
Samsung Electronics Co., Ltd., Suwon-si, KR;
Seonghoon Park, Suwon-si, KR;
Hyoun Soo Park, Suwon-si, KR;
Abstract
A test apparatus includes an input terminal, a first multiplexer, a plurality of first elements connected in series between the input terminal and the first multiplexer, and a processor. The first multiplexer is connected to each of a plurality of nodes between the plurality of first elements, and the processor is connected to the input terminal and to the first multiplexer. The processor inputs data to the plurality of first elements through the input terminal. The plurality of first elements outputs at least a portion of a plurality of pieces of data through the plurality of nodes between the elements to the first multiplexer. The processor may thereby determine whether a defect has occurred in any of the plurality of first elements by comparing data, output from the multiplexer, with an expected output value.