The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Dec. 14, 2021
Applicant:

Lunit Inc., Seoul, KR;

Inventors:

Donggeun Yoo, Seoul, KR;

Jaehong Aum, Seoul, KR;

Minuk Ma, Seoul, KR;

Jeong Un Ryu, Seoul, KR;

Assignee:

LUNIT INC., Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06N 20/00 (2019.01); G16H 30/20 (2018.01); G16H 50/20 (2018.01);
U.S. Cl.
CPC ...
G16H 50/20 (2018.01); G06N 20/00 (2019.01); G06T 7/0012 (2013.01); G16H 30/20 (2018.01); G06T 2207/20081 (2013.01);
Abstract

A method, performed by at least one processor, for training a machine learning model for detecting an abnormal region in a pathological slide image is disclosed. The method including receiving one or more first pathological slide images, determining, from the received one or more first pathological slide images, a normal region based on an abnormality condition indicative of a condition of an abnormal region, generating a first set of training data including the determined normal region, generating the abnormal region by performing image processing corresponding to the abnormality condition with respect to at least partial region in the received one or more first pathological slide images, and generating a second set of training data including the generated abnormal region.


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