The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jan. 17, 2024
Applicant:

GE Precision Healthcare Llc, Waukesha, WI (US);

Inventors:

Abderrazek Boufahja, Illkirch-Graffenstaden, FR;

Hervé Hoehn, Antony, FR;

Assignee:

GE Precision Healthcare LLC, Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G16H 40/20 (2018.01); G06F 11/3668 (2025.01);
U.S. Cl.
CPC ...
G16H 40/20 (2018.01); G06F 11/3684 (2013.01);
Abstract

A system and method are provided for conformance testing of a Fast Healthcare Interoperability Resources (FHIR) server. Information related to the FHIR standard may be received. A test script including a query for a resource stored by the FHIR server using a search value of a search parameter of the resource and using a search variation of a type of the search parameter may be generated and executed. A capability statement for the FHIR server may be generated. A declared capability statement of the FHIR server may be validated based on the generated capability statement. Information related to a validation result of the declared capability statement may be provided for display.


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