The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Nov. 22, 2023
Applicant:

Sandisk Technologies, Inc., Milpitas, CA (US);

Inventors:

Ganapati Bhat, Bengaluru, IN;

Binoy Jose Panakkal, Kochi, IN;

Gopu S, Kollam, IN;

Bhavadip Bipinbhai Solanki, Bengaluru, IN;

Assignee:

Sandisk Technologies, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/08 (2006.01); G11C 16/10 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G11C 16/08 (2013.01); G11C 16/102 (2013.01); G11C 16/3459 (2013.01);
Abstract

When an open block of NAND memory is read, this places the edge word lines under a set of bias conditions that can lead to disturbs. When time tag values are stored on predefined word lines, and the predefined word line is an edge word line, this can degrade not just the user data on the word line, but also the time tag values, leading to a failed bit count spike. To address this problem, a time tag word line shift approach is introduced where, if a predetermined time tag acquisition word line is an edge word line, another word line is instead used to acquire the time tag value.


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