The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Oct. 02, 2024
Applicants:

Regents of the University of Michigan, Ann Arbor, MI (US);

The Board of Trustees of the University of Illinois, Urbana, IL (US);

Inventors:

Bradley Sturt, Urbana, IL (US);

John Alexander Halderman, Ann Arbor, MI (US);

Braden L. Crimmins, Ann Arbor, MI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G07C 13/00 (2006.01); G07C 13/02 (2006.01); H04L 9/06 (2006.01); H04N 1/107 (2006.01);
U.S. Cl.
CPC ...
G07C 13/02 (2013.01); H04L 9/0643 (2013.01); H04N 1/1074 (2013.01);
Abstract

The following relates generally to error detection in voting systems, and, in particular voting systems using optical scan machines. In some embodiments, one or more processors are configured to: (1) capture, with an optical scan machine, original image data; (2) isolate a first subimage of the original image data; (3) associate the first subimage with a first configuration file candidate, wherein the first configuration file candidate is indicated by a configuration file configuring the optical scan machine, and wherein the association is done according to the configuration file; and (4) display the first subimage along with a representation of the first configuration file candidate.


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