The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jun. 23, 2020
Applicant:

Nec Corporation, Tokyo, JP;

Inventor:

Hiroo Ikeda, Tokyo, JP;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/73 (2017.01); G06T 7/60 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30242 (2013.01);
Abstract

An object position estimation device () is provided with: a feature extraction unit () including a first feature extraction unit () which generates a first feature map by subjecting a target image to a convolution computation process, and a second feature extraction unit () which generates a second feature map by also subjecting the first feature map to the convolution computation process; and a likelihood map estimation unit () including a first position likelihood estimation unit () which, by using the first feature map, estimates a first likelihood map indicating the probability that first objects having a first size are present in the target image, and a second position likelihood estimation unit () which, by using the second feature map, estimates a second likelihood map indicating the probability that second objects having a second size, which is greater than the first size, are present in the target image.


Find Patent Forward Citations

Loading…