The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Nov. 03, 2021
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Antoine Olivier, Suresnes, FR;
Caroline Denise Francoise Raynaud, Suresnes, FR;
Cybele Ciofolo-Veit, Meudon, FR;
Laurence Rouet, Paris, FR;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/00 (2017.01); G06T 7/60 (2017.01);
U.S. Cl.
CPC ...
G06T 7/11 (2017.01); G06T 7/0012 (2013.01); G06T 7/60 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/30044 (2013.01); G06T 2207/30168 (2013.01);
Abstract
A method of analyzing an ultrasound image involves assessing the quality of the image in terms of which features of interest have been identified in the image and assessing a segmentation quality relating to the quality of a segmentation of the image. The two quality assessments are combined to derive and output an overall quality assessment for biometry measurements obtained from the image.