The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Sep. 01, 2022
Applicant:

Fujifilm Business Innovation Corp., Tokyo, JP;

Inventors:

Atsushi Ogihara, Kanagawa, JP;

Tomonari Takahashi, Kanagawa, JP;

Ryosuke Higashikata, Kanagawa, JP;

Yasuyuki Tanaka, Kanagawa, JP;

Yasushi Uemura, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06T 7/62 (2017.01); G06T 7/90 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 7/62 (2017.01); G06T 7/90 (2017.01); G06T 2207/30164 (2013.01);
Abstract

An information processing apparatus includes a processor configured to: extract, as an inspection target item, product manufacturing information needed for inspection from three-dimensional model data including the product manufacturing information needed when a molded product is manufactured; and set one or more measurement points at which an inspection target site is to be measured and a number of the one or more measurement points according to information related to the extracted product manufacturing information as the inspection target item.


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