The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

May. 11, 2023
Applicant:

GE Precision Healthcare Llc, Wauwatosa, WI (US);

Inventor:

Scott David Wollenweber, Waukesha, WI (US);

Assignee:

GE PRECISION HEALTHCARE LLC, Waukesha, WI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01); A61B 6/03 (2006.01); A61B 6/42 (2024.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); A61B 6/032 (2013.01); A61B 6/4291 (2013.01); G06T 11/005 (2013.01);
Abstract

A method for estimating noise equivalent counts includes one or more times during a scan of an object with a positron emission tomography (PET) scanner, wherein a plurality of coincidence events are detected by a detector array of the PET scanner, performing the following actions. The actions include obtaining a total of the plurality of coincidence events, estimating random coincidence events, and estimating scatter coincidence events. The actions include estimating true coincidence events based on the total of the plurality of coincidence events, the estimated random coincidence events, and the estimated scatter coincidence events. The actions include determining a scatter fraction based on the estimated scatter events and true coincidence events. The actions include estimating the noise equivalent counts based at least on the scatter fraction, the total of the plurality of coincidence events, the estimated true coincidence events, the estimated scatter coincidence events, and the estimated random coincidence events.


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