The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Apr. 16, 2024
The Regents of the University of California, Oakland, CA (US);
Aydogan Ozcan, Los Angeles, CA (US);
Hanlong Chen, Los Angeles, CA (US);
Luzhe Huang, Los Angeles, CA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A deep learning framework, termed Fourier Imager Network (FIN) is disclosed that can perform end-to-end phase recovery and image reconstruction from raw holograms of new types of samples, exhibiting success in external generalization. The FIN architecture is based on spatial Fourier transform modules with the deep neural network that process the spatial frequencies of its inputs using learnable filters and a global receptive field. FIN exhibits superior generalization to new types of samples, while also being much faster in its image inference speed, completing the hologram reconstruction task in ˜0.04 s per 1 mmof the sample area. Beyond holographic microscopy and quantitative phase imaging applications, FIN and the underlying neural network architecture may open up various new opportunities to design broadly generalizable deep learning models in computational imaging and machine vision fields.