The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Feb. 21, 2024
Applicant:

Ingram Micro Inc., Irvine, CA (US);

Inventor:

Sanjib Sahoo, Naperville, IL (US);

Assignee:

Ingram Micro Inc., Irvine, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/25 (2019.01); G06Q 10/0631 (2023.01); G06Q 30/0201 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0206 (2013.01); G06F 16/254 (2019.01); G06F 16/256 (2019.01); G06Q 10/06315 (2013.01);
Abstract

System and methods are provided for achieving data standardization and normalization through an Agnostic Data Format (ADF) architecture. ADFs systems and processes provide a transformative bridge, enabling disparate data sources to converge into a unified and standardized format within the Real-Time Data Mesh (RTDM) framework. This dynamic process utilizes Artificial Intelligence (AI) and Machine Learning (ML) algorithms to interpret and align diverse data attributes. The ADF management system, integrated into a dynamic event-driven architecture, allows vendors to interact with RTDM by translating and standardizing their data. The synchronized data integrates canonically, incorporating real-time updates and collaborative decision-making across the distribution platform. This innovative approach enhances operational efficiency, enables data-driven decision-making, and provides users improved ability to use data within the distribution ecosystem.


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