The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Nov. 07, 2022
Microsoft Technology Licensing, Llc, Redmond, WA (US);
Samuel Boutin, Goleta, CA (US);
Roman Bela Bauer, Santa Barbara, CA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
A method for simulating a quantum-capacitance response of a material configuration comprises (a) constructing a non-interacting Hamiltonian for the material configuration based on input data; (b) computing a natural-orbitals basis for each of a plurality of parts of the material configuration under the non-interacting Hamiltonian; (c) projecting the non-interacting Hamiltonian in the natural-orbitals basis to obtain a non-interacting quantum-mechanical description for each part; (d) constructing an interacting Hamiltonian by adding an electron-interaction term to the non-interacting Hamiltonian for each of the plurality of parts; (e) for each of a plurality of representative points in a sample space of at least one tunable parameter of the material configuration, using a sums-of-Gaussians procedure to assemble a basis of Gaussian states for approximating low-energy eigenstates of the material configuration under the interacting Hamiltonian; (f) for each of a plurality of vicinities of representative points in the sample space, combining bases of Gaussian states assembled for nearby representative points to form an extended basis; and (g) forecasting the quantum-capacitance response within the sample space using the extended basis.