The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Dec. 15, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Andrew C.M. Hicks, Wappingers Falls, NY (US);

Deborah A. Furman, Staatsburg, NY (US);

Michael Terrence Cohoon, Fishkill, NY (US);

Michael E Gildein, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2023.01); G06F 18/20 (2023.01); G06F 18/21 (2023.01); G06N 3/045 (2023.01); G06N 3/063 (2023.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06F 18/217 (2023.01); G06F 18/285 (2023.01); G06N 3/045 (2023.01); G06N 3/063 (2013.01);
Abstract

Aspects of the invention include mutating each neural network of a portion of a first array of neural networks, wherein each neural network of the first array of neural networks is configured to select a respective sequence of test cases for testing a computing infrastructure. Causing each neural network of a second array of neural networks to select a respective sequence of test cases for testing the computing infrastructure. Generating a child neural network by performing a crossover operation between a mutated neural network of the portion of the first array and a neural network of the second array of neural networks, the child neural network generating a new sequence of test cases for testing the computing infrastructure.


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