The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Dec. 21, 2023
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Lei Gao, Xian, CN;

Jin Wang, Xian, CN;

A Peng Zhang, Xian, CN;

Kai Li, Xian, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/22 (2006.01); G06F 9/54 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2268 (2013.01); G06F 9/547 (2013.01);
Abstract

An approach for collecting diagnostic information, associated with a software system, based on identifying an abnormal log. The approach predicts a first time interval associated with a current log message based on one or more trained models and a first previous log message. The approach determines if a log is a suspected abnormal log based on the time interval. The approach, responsive to the log being a suspected abnormal log, executes actions of collecting additional diagnostic information based on a baseline diagnostic information collection rate, determines if the log is no longer a suspected abnormal log based at least on a second time interval. The approach, responsive to the log no longer being a suspected abnormal log, returns to the baseline diagnostic information collection rate.


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