The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Jan. 10, 2023
Nec Laboratories America, Inc., Princeton, NJ (US);
Nec Corporation, Tokyo, JP;
Luan Tang, Pennington, NJ (US);
Haifeng Chen, West Windsor, NJ (US);
Yuncong Chen, Plainsboro, NJ (US);
Wei Cheng, Princeton Junction, NJ (US);
Zhengzhang Chen, Princeton Junction, NJ (US);
Yuji Kobayashi, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
Methods and systems for anomaly detection include determining whether a system is in a stable state or a dynamic state based on input data from one or more sensors in the system, using reconstruction errors from a respective stable model and dynamic model. It is determined that the input data represents anomalous operation of the system, responsive to a determination that the system is in a stable state, using the reconstruction errors. A corrective operation is performed on the system responsive to a determination that the input data represents anomalous operation of the system.