The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Mar. 30, 2021
Applicant:

Psiquantum Corporation, Palo Alto, CA (US);

Inventor:

Henrik Johansson, Wilton, NY (US);

Assignee:

PSIQUANTUM CORP., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 6/136 (2006.01); G02B 6/12 (2006.01); H01L 21/311 (2006.01);
U.S. Cl.
CPC ...
G02B 6/136 (2013.01); H01L 21/31122 (2013.01); H01L 21/31144 (2013.01); G02B 2006/12061 (2013.01); G02B 2006/12097 (2013.01); G02B 2006/12159 (2013.01); G02B 2006/12176 (2013.01);
Abstract

Methods and apparatus for etching a wafer. The wafer is positioned adjacent to a cathode within a vacuum chamber. The wafer includes a first layer stack, where the first layer stack includes a crystalline composition of a first element and a second element different from the first element. The crystalline composition may be BaTiO3 (BTO). A gas is received that includes a first partial gas and a second partial gas. The first and second partial gases may be HBr and Cl2, respectively. The gas is ionized, and the wafer is chemically etched by bombarding the layer stack with the ionized gas. The chemical etching includes reacting the first partial gas with the first element and reacting the second partial gas with the second element.


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