The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Dec. 24, 2021
Shanghai Jiao Tong University, Shanghai, CN;
Liangjun Lu, Shanghai, CN;
Weihan Xu, Shanghai, CN;
Linjie Zhou, Shanghai, CN;
Jianping Chen, Shanghai, CN;
Jiao Liu, Shanghai, CN;
Shanghai Jiao Tong University, Shanghai, CN;
Abstract
A calibration system and related methods for optical phased array chips. The calibration system includes an adjustable mount module, an infrared microscopic observation module, an arrayed driver module, a two-dimensional laser beam scanning module, a photoelectric conversion module and an upper computer, and utilizes computer-vision-enabled positioning and phase error compensation algorithms as software components. Collimated laser is emitted from the target beamforming angle and aimed at the emission aperture of the chip, and is subsequently sampled by the array elements in a reversed injection manner. Based on the reciprocity of light propagation, by maximizing the power reversely output from the bus waveguide of the optical phased array chip, beamforming at the target angle is achieved supported by software implementations of optimization algorithms. The system and related methods are readily achievable, highly automated, and offers fast and batch calibration with relatively low expenses, good flexibility and long-term compatibility.