The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Jan. 28, 2021
Denso Corporation, Kariya, JP;
Mitsuhiro Kiyono, Kariya, JP;
Teiyuu Kimura, Kariya, JP;
Noriyuki Ozaki, Kariya, JP;
Kenichi Yanai, Kariya, JP;
Shinji Kashiwada, Kariya, JP;
Fumiaki Mizuno, Kariya, JP;
Kazuhisa Onda, Kariya, JP;
DENSO CORPORATION, Kariya, JP;
Abstract
An optical detector is configured to project a projection beam toward a measurement area and detect a return beam from the measurement area. The optical detector includes: a projecting optical system that forms a projection optical axis to project the projection beam; a receiving optical system that forms a receiving optical axis to receive the return beam, and a housing having a housing chamber to house the projecting optical system and the receiving optical system, and an optical window for the projection beam and the return beam to travel between the housing chamber and the measurement area. The projection optical axis and the receiving optical axis are offset from each other to define an overlap region inside the housing chamber where footprints of the projection beam and the return beam overlap with each other.