The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Oct. 26, 2020
Applicant:

University of Louisville Research Foundation, Inc., Louisville, KY (US);

Inventors:

Thomas J. Roussel, Jr., Louisville, KY (US);

Nichola C. Garbett, Louisville, KY (US);

Alexa M. Melvin, Louisville, KY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/48 (2006.01); G01K 17/00 (2006.01);
U.S. Cl.
CPC ...
G01N 25/4866 (2013.01); G01K 17/006 (2013.01); G01N 25/4813 (2013.01);
Abstract

A differential scanning calorimetry sensor, comprises a substrate; a heater trace comprising a conductive material, on the substrate; an encapsulation layer, on the substrate and on the heater trace; and a sample heating area, which is on the heater trace. The heater trace has a thickness of 50 to 1000 nm, a width of 1 to 100 pm, and a path length of 5 to 500 mm. Also described are a sample holder, a sensor enclosure and a thermal analysis sensor system.


Find Patent Forward Citations

Quick Actions:

Roussel, Jr., Thomas. (2025). Microfabricated differential scanning calorimetry system and methods of use thereof (U.S. Patent No. 12487200). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12487200

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…