The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
May. 30, 2022
The Wave Talk, Inc., Daejeon, KR;
Young Dug Kim, Seongnam-si, KR;
Kyoung Man Cho, Seoul, KR;
THE WAVE TALK, INC., Daejeon, KR;
Abstract
Provided is an accurate turbidity measurement system and method, using a speckle pattern, in which a speckle pattern may be used for turbidity measurement, thereby enabling turbidity and bacterial or microbial contamination to be measured with high accuracy. The system may include: a measuring container which has a light input part formed in one side thereof, has a light scattering space formed therein, and has a light output part formed in the other side thereof; and an optical dilution member which is formed in at least a portion of the light scattering space, has a sample receiving part formed in one side thereof, and comprises an optical dilution medium having a role of optically diluting a speckle pattern of the sample.