The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Mar. 24, 2021
Applicant:
Flooring Technologies Ltd., Kalkara, MT;
Inventor:
Norbert Kalwa, Horn-Bad Meinberg, DE;
Assignee:
Flooring Technologies Ltd., Kalkara, MT;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/359 (2014.01); G01N 21/27 (2006.01); G01N 21/84 (2006.01); G01N 21/86 (2006.01);
U.S. Cl.
CPC ...
G01N 21/359 (2013.01); G01N 21/274 (2013.01); G01N 2021/8416 (2013.01); G01N 2021/8427 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8472 (2013.01); G01N 2021/8663 (2013.01); G01N 2201/101 (2013.01);
Abstract
Provided is a method for the simultaneous determination of parameters, in particular of at least two, three or four parameters, of at least one resin layer applied to at least one carrier material by recording and evaluating at least one NIR spectrum in a wavelength range between 500 nm and 2500 nm, preferably between 700 nm and 2000 nm, more preferably between 900 nm and 1700 nm, and particularly advantageously between 1450 nm and 1550 nm, using at least one NIR measuring head, in particular at least one NIR multimeter head.