The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Mar. 02, 2018
Applicant:

Alfresa Pharma Corporation, Osaka, JP;

Inventors:

Kazuya Nishimura, Osaka, JP;

Yosuke Doi, Osaka, JP;

Yuko Fukumoto, Osaka, JP;

Shiqin Wu, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/82 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
G01N 21/31 (2013.01); G01N 33/543 (2013.01); G01N 2021/825 (2013.01); G01N 2201/127 (2013.01);
Abstract

Provided are an analysis device, an analysis method, and the like that predict a concentration even for a sample having high concentration that can be outside a measurement range as it is, using an absorbance measurement result in a reaction course at the time of measurement of a test liquid containing an immunological reagent and the sample, and determine an optimum dilution rate to conduct measurement. As the present invention, for example, an analysis device having means (A) that detects a prozone during measurement of a sample, and means (B) that determines a high concentration region by automatically determining a dilution rate of the test liquid can be recited.


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