The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Oct. 03, 2023
Applicant:

Contemporary Amperex Technology (Hong Kong) Limited, Hong Kong, CN;

Inventors:

Liangjie Yan, Ningde, CN;

Qian Wu, Ningde, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 9/24 (2006.01); H01M 4/04 (2006.01);
U.S. Cl.
CPC ...
G01N 9/24 (2013.01); H01M 4/04 (2013.01);
Abstract

A surface density measurement method includes: obtaining a single-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a single-sided electrode plate, where the single-sided-electrode-plate transverse scan result includes a blank zone scan result of a blank zone of the single-sided electrode plate and a single-side coating zone scan result of the single-sided electrode plate; obtaining a double-sided-electrode-plate transverse scan result by performing a ray source-based transverse scan on a double-sided electrode plate, where the double-sided electrode plate is an electrode plate obtained by coating the single-sided electrode plate, and the double-sided-electrode-plate transverse scan result includes a double-side coating zone scan result of the double-sided electrode plate; and obtaining surface densities of the electrode plate by analyzing the single-sided-electrode-plate transverse scan result and the double-sided-electrode-plate transverse scan result.


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