The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 02, 2025
Filed:
Nov. 20, 2022
Applicant:
Zhejiang Huaray Technology Co., Ltd., Zhejiang, CN;
Inventors:
Assignee:
ZHEJIANG HUARAY TECHNOLOGY CO., LTD., Hangzhou, CN;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01B 11/00 (2006.01); G06T 7/80 (2017.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G01B 11/002 (2013.01); G01B 11/2504 (2013.01); G06T 7/80 (2017.01); G06T 2207/30244 (2013.01);
Abstract
The present disclosure relates to systems and methods for object measurement. The systems may obtain an image of an object with a light bar acquired by an imaging device. The light bar may be formed by an optical sensor irradiating the object with a light beam. The systems may obtain a measurement model. The measurement model may be configured to simulate a curved surface formed by the light beam. The systems may determine position information of at least a portion of the object based at least in part on the image of the object with the light bar and the measurement model.