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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12485598 B1

PDFFull Text
Date of Patent:
Dec. 02, 2025

Filed:

Jul. 16, 2021

Operation abnormality detection method, method for manufacturing resin container, operation abnormality detection device, device for manufacturing resin container, and device for manufacturing resin preform

Applicant:

Nissei Asb Machine Co., Ltd., Nagano, JP;

Inventors:

Yasuhiro Hidaka, Nagano, JP;

Tatsuya Koshimizu, Nagano, JP;

Terumasa Okada, Nagano, JP;

Assignee:

NISSEI ASB MACHINE CO., LTD., Nagano, JP;

Attorney:

Greenblum & Bernstein, P.L.C.

Primary Examiner:

Fatemeh Esfandiari Nia

Int. Cl.
CPC ...
B29C 45/76 (2006.01); B29C 49/06 (2006.01); B29C 49/78 (2006.01);
U.S. Cl.
CPC ...
B29C 45/768 (2013.01); B29C 49/06 (2013.01); B29C 49/78 (2013.01); B29C 2049/7876 (2022.05); B29C 2049/7878 (2022.05); B29C 2945/76224 (2013.01); B29C 2945/76321 (2013.01); B29C 2945/76391 (2013.01); B29C 2945/76394 (2013.01); B29C 2945/76421 (2013.01); B29C 2945/76943 (2013.01);
Abstract

An operation abnormality detection method for detecting an operation abnormality in a molding device having a movable part includes: acquiring a prescribed measured value relating to operation of the movable part and calculating, as statistical information, an average value of prescribed information values based on the prescribed measured values: calculating a first threshold and a second threshold; acquiring a current measured value and comparing a current information value based on the current measured value with the greater of the first threshold and the second threshold; and issuing a warning if the current information value at least exceeds the greater of the first threshold and the second threshold.

Find Patent Forward Citations

Hidaka, Yasuhiro. (2025). Operation abnormality detection method, method for manufacturing resin container, operation abnormality detection device, device for manufacturing resin container, and device for manufacturing resin preform (U.S. Patent No. 12485598). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12485598

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