The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 02, 2025

Filed:

Jul. 29, 2022
Applicant:

Microtec S.r.l., Bressanone, IT;

Inventor:

Enrico Ursella, Mestre, IT;

Assignee:

MICROTEC S.R.L., Bressanone, IT;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B27L 5/02 (2006.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
B27L 5/02 (2013.01); B27L 5/022 (2013.01); G06T 7/001 (2013.01); G06T 7/70 (2017.01); G06T 2207/30161 (2013.01);
Abstract

Method for determining an angular orientation of a log () about one of its longitudinal development axes, comprising a first generation step, during which one or more first digital images are generated of the lateral surface of the log placed in a reference position, using one or more first digital photographs, a second generation step, during which one or more second digital images are generated of the lateral surface () of the log () placed in a second position using the one or more second digital photographs, a step of comparing the one or more second digital images with the one or more first digital images, and a step of determining the angular orientation of the log () in the second position with reference to a reference angular orientation of the log () in the reference position, based on information related to the first digital images and the second digital images for which a match was identified. Also claimed is a device which can implement is programmed to perform the following of the steps described above: the second generation step, the comparison step and the determination step.


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