The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Jul. 29, 2022
Applicant:

Suzhou China Star Optoelectronics Technology Co., Ltd., Jiangsu, CN;

Inventors:

Hao Wu, Jiangsu, CN;

Wenbing Zhang, Jiangsu, CN;

Feng Gao, Jiangsu, CN;

Zhenhua Rao, Jiangsu, CN;

Yufei Xia, Jiangsu, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H10F 39/18 (2025.01); H01L 25/16 (2023.01); H04N 17/00 (2006.01); H10F 39/00 (2025.01);
U.S. Cl.
CPC ...
H10F 39/18 (2025.01); H01L 25/167 (2013.01); H04N 17/002 (2013.01); H10F 39/8057 (2025.01); H10F 39/8063 (2025.01); H10F 39/811 (2025.01);
Abstract

The present invention relates to a CMOS image chip, a camera, thereof, and a debugging method thereof. The CMOS image chip of the present invention disposes light emitting diodes in a light emitting region and uses a projection pattern of the light emitting diodes on a substrate to be inspected to determine a photosensitive effective region of the CMOS image chip on the underlay to prevent the issue that the conventional technology uses an image by camera imaging on a display device as debug basis and a camera imaging image has signal delay to result in a low debugging efficiency, which drastically improves a debugging efficiency of the camera.


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