The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Aug. 15, 2023
Leia Inc., Menlo Park, CA (US);
Chelhwon Kim, Palo Alto, CA (US);
Yiwen Hua, Foster City, CA (US);
David A. Fattal, Mountain View, CA (US);
LEIA SPV LLC, Menlo Park, CA (US);
Abstract
Systems and methods are directed to multiview format detection. A multiview image that comprises a plurality of tiled view images is accessed. A cross-correlation map from the multiview image may be generated by autocorrelating the multiview image with a shifted copy of the multiview image. The cross-correlation map may be sampled at a plurality of predefined locations of the cross-correlation map to identify a set of cross-correlation values. A multiview format of the multiview image may be detected by classifying a feature set of the multiview image that comprises the set of cross-correlation values. The multiview image may be configured to be rendered on a multiview display based on the multiview format.