The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Nov. 17, 2023
Applicant:
Seiko Epson Corporation, Tokyo, JP;
Inventor:
Takashi Natori, Suwa, JP;
Assignee:
SEIKO EPSON CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 9/31 (2006.01);
U.S. Cl.
CPC ...
H04N 9/3191 (2013.01); H04N 9/3108 (2013.01);
Abstract
An abnormality determination method includes: acquiring first information indicating a state of a first display device configured to display a first portion of a first image in a first area of a display area that displays the first image; acquiring second information indicating a state of a second display device configured to display a second portion of the first image that is different from the first portion in a second area of the display area that is different from the first area; and determining whether the first information is abnormal based on the second information.