The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jan. 18, 2023
Crystal Instruments Corporation, Santa Clara, CA (US);
James Q. Zhuge, Palo Alto, CA (US);
Crystal Instruments Corporation, Santa Clara, CA (US);
Abstract
A measurement system has a data acquisition architecture in one or more channels with storage in multiple sensor ranges. At least one sensor channel provides an analog measurement input signal, which is split into first and second amplifier-ADC paths, where a first path has relatively higher gain and smaller range than a second path. The digitized data is subject to cross-channel calibration that can serve as a trigger for the transfer of the two data streams into nonvolatile memory. The incoming data are temporarily stored for a specified period in a circular buffer, so that the trigger can also facilitate transfer of pre-trigger data from the buffer into the memory. A processor determines the presence or absence of any clipping of the higher-gain/smaller-range data and selects analysis of that smaller range data if no clipping is detected, but of the larger range data if clipping is detected.