The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Mar. 31, 2024
Applicant:

Tcl China Star Optoelectronics Technology Co., Ltd., Guangdong, CN;

Inventors:

Yixin Xiao, Guangdong, CN;

Junli Xie, Guangdong, CN;

Kaihao Mao, Guangdong, CN;

Shunqiang You, Guangdong, CN;

Zhixiang Tang, Guangdong, CN;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/20 (2006.01);
U.S. Cl.
CPC ...
G09G 3/2074 (2013.01); G09G 2320/0233 (2013.01); G09G 2320/0693 (2013.01);
Abstract

A luminance compensation method. According to the method, a central calibration point is acquired on the sampled image. A plurality of third calibration points is generated on the sampled image based on the central calibration point. The sampled image is divided into a plurality of regions to be corrected. A corrected position of each second calibration point in any one of the regions to be corrected is acquired for an initial position of each third calibration point in the region to be corrected. An affine transformation correction is performed on the sampled image based on the corrected positions of all the second calibration points and reference positions of the first calibration points corresponding to the second calibration points, so that a corrected image is acquired. And luminance data of a reference image is compensated to the sampled image.


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