The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Sep. 11, 2023
Applicant:

The Boeing Company, Arlington, VA (US);

Inventor:

Isaac M. Jeng, Seal Beach, CA (US);

Assignee:

The Boeing Company, Arlington, VA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/46 (2022.01); G06T 3/60 (2006.01); G06T 5/50 (2006.01); G06V 10/26 (2022.01);
U.S. Cl.
CPC ...
G06V 10/46 (2022.01); G06T 3/60 (2013.01); G06T 5/50 (2013.01); G06V 10/26 (2022.01); G06T 2207/20221 (2013.01);
Abstract

Reconstructing a partially obscured elliptical antenna dish image is provided. An image of an antenna dish contour with an obscured section is received, and a centroid for use as an origin reference is determined. Indices are sequentially assigned to samples along the contour starting with a sample having zero polar angle according to the origin reference. Sets of randomly selected N samples along the contour are prepared and used to perform least squares fit (LSF) to determine a cost function for each set. Cost functions with LSF residuals below a specified threshold show good quality-of-fit. An ensemble mean of the cost functions with good quality-of-fit is calculated. Outlier samples are identified according to local extrema for the ensemble mean. Samples having poor quality-of-fit of the ensemble mean between the extrema are considered outliers. Inlier samples are used to reconstruct the obscured section of the contour.


Find Patent Forward Citations

Jeng, Isaac. (2025). Reconstruction of obscured objects in segmentation maps (U.S. Patent No. 12482219). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12482219

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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