The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Dec. 16, 2020
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Rafael Wiemker, Kisdorf, DE;
Tom Brosch, Hamburg, DE;
Hrishikesh Narayanrao Deshpande, Hamburg, DE;
André Goossen, Eldena, DE;
Tim Philipp Harder, Ahrensburg, DE;
Axel Saalbach, Hamburg, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06F 17/18 (2006.01); G06T 7/11 (2017.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/60 (2013.01); G06T 7/0012 (2013.01); G06T 7/11 (2017.01); G06T 2207/20081 (2013.01);
Abstract
A computer implemented method of making a measurement associated with a feature of interest in an image. The method comprises using () a model trained using a machine learning process to take the image as input and predict a pair of points between which to make the measurement of the feature of interest in the image. The method then comprises determining () the measurement, based on the predicted pair of points.