The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Dec. 28, 2023
Applicant:

Keyence Corporation, Osaka, JP;

Inventors:

Masayasu Ikebuchi, Osaka, JP;

Hitoshi Sakai, Osaka, JP;

Shuji Shimonaka, Osaka, JP;

Assignee:

KEYENCE CORPORATION, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/55 (2017.01); G01B 11/25 (2006.01); G06T 7/13 (2017.01); G06T 7/521 (2017.01); G06T 7/73 (2017.01); H04N 23/56 (2023.01);
U.S. Cl.
CPC ...
G06T 7/55 (2017.01); G01B 11/25 (2013.01); G06T 7/13 (2017.01); G06T 7/521 (2017.01); G06T 7/74 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/30204 (2013.01); G06T 2207/30244 (2013.01); H04N 23/56 (2023.01);
Abstract

High-speed scanning is implemented by a three-dimensional scanner. A three-dimensional measurement device includes: a three-dimensional scanner including a scanner image processing unit that generates first measurement information by processing a first image including pattern light; an imaging unit including a camera image processing unit that generates second measurement information by processing a second image including a self-luminous marker provided in the three-dimensional scanner; and a three-dimensional data generation mechanism. The three-dimensional data generation mechanism receives the first measurement information and the second measurement information, and generates a point cloud indicating a three-dimensional shape of a measurement target based on the received first measurement information and second measurement information, and identification information.


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