The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jul. 10, 2023
Pictometry International Corp., Rochester, NY (US);
Stephen Ng, Rochester, NY (US);
David R. Nilosek, Rochester, NY (US);
Phillip Salvaggio, Rochester, NY (US);
Shadrian Strong, Bellevue, WA (US);
Pictometry International Corp., Rochester, NY (US);
Abstract
Systems and methods for automated detection of changes in extent of structures using imagery are disclosed, including a non-transitory computer readable medium storing computer executable code that when executed by a processor cause the processor to: align an outline of a structure at a first instance of time to pixels within an image depicting the structure, the image captured at a second instance of time; assess a degree of alignment between the outline and the pixels within the image depicting the structure, using a machine learning model to generate an alignment confidence score; determine an existence of a change in extent of the structure based upon the alignment confidence score indicating that the outline and the pixels within the image are not aligned; identify a shape of the change in extent of the structure; and store the shape of the change in extent of the structure.