The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Mar. 09, 2022
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventor:
Daiki Harada, Kanagawa, JP;
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/46 (2024.01); A61B 6/00 (2024.01); G06T 3/60 (2006.01); G06T 7/00 (2017.01); G06T 7/70 (2017.01); G06V 10/98 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); A61B 6/463 (2013.01); A61B 6/54 (2013.01); G06T 3/60 (2013.01); G06T 7/70 (2017.01); G06T 2200/24 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/20132 (2013.01); G06T 2207/30168 (2013.01);
Abstract
An image inspection device includes a radiation image acquisition unit that acquires a radiation image obtained by imaging a subject using radiation, an imaging condition recognition unit that recognizes an imaging condition relating to an imaging direction and/or laterality of the subject reflected in the radiation image, and a marker superimposition unit that superimposes, on the radiation image, a marker indicating the imaging direction and/or laterality of the subject reflected in the radiation image by using a result of the recognition of the imaging condition recognition unit.