The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jan. 13, 2021
Hewlett-packard Development Company, L.p., Spring, TX (US);
Purdue Research Foundation, West Lafayette, IN (US);
Runzhe Zhang, West Lafayette, IN (US);
Yousun Bang, Pangyo, KR;
Minki Cho, Pangyo, KR;
Mark Shaw, Boise, ID (US);
Jan Allebach, West Lafayette, IN (US);
Yi Yang, West Lafayette, IN (US);
HEWLETT-PACKA RD DEVELOPMENT COMPANY, LP., Spring, TX (US);
Abstract
According to examples, an apparatus may include a processor and a memory on which are stored computer-readable instructions that, when executed by the processor, may cause the processor to access a master image to be printed and receive a scanned image corresponding to the master image. The processor may identify a defect in a scanned image region of interest (ROI) based on the master image. A type of the scanned image ROI may include a raster ROI, a symbol ROI, a background ROI, and/or a color vector ROI, and the identified defect may be associated with the type of the scanned image ROI. The processor may determine a severity of the identified defect of the scanned image and may output the determined severity.