The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Nov. 12, 2021
Future Dial, Inc., Sunnyvale, CA (US);
Jisheng Li, Los Altos, CA (US);
Qing Zhang, Cupertino, CA (US);
Future Dial, Inc., Sunnyvale, CA (US);
Abstract
A method includes receiving, by a processor, a plurality of images of a test object, the plurality of images including a plurality of surfaces of the test object. The processor receives an image of a barcode on the test object. The processor selects a region of interest in each of the plurality of images of the test object. The region of interest includes the test object having a background removed. For the plurality of regions of interest as selected, the processor compares each region of interest with a corresponding profile image and identifying defects in each region of interest. The corresponding profile image is determined from the image barcode on the test object. The method includes grading, by the processor, a cosmetic appearance of each region of interest based on the identified defects. The method includes storing the grades of the cosmetic appearance for each region of interest.