The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Nov. 09, 2022
Advanced Vision Technology (A.v.t.) Ltd., Hod Hasharon, IL;
Dani Zamir, Hod Hasharon, IL;
Barry Ben Ezra, Ramat Hasharon, IL;
Chanan Gazala, Kfar Saba, IL;
Leon Kanelovitch, Hod Hasharon, IL;
Abstract
A method and system for implementation of quality control includes a machine vision system for capturing images of instances of a product, and a computer system including computer memory containing machine-readable instructions executable by a processor. The processor evaluates the quality control images for a plurality of potential quality defects in the product and generates a defect alert associated with a captured image in which at least one potential quality defect is identified. Information about each defect alert is stored in a database log file in the computer memory. A neural network machine learning algorithm processes the database log file by, in a learning phase, receiving human-initiated input accepting or rejecting each defect alert and storing the human-initiated input in the log file, and, in an automated phase, automatically accepting or rejecting at least some defect alerts without performing the step of receiving human initiated input.