The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

May. 12, 2021
Applicant:

Fill Gesellschaft M.b.h., Gurten, AT;

Inventors:

Fabian Oblinger, St. Georgen bei Obernberg, AT;

Nikolaus Weinberger, Wippenham, AT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/25 (2006.01); G01N 35/00 (2006.01); G06T 7/00 (2017.01); G06T 7/521 (2017.01); G06T 7/586 (2017.01); G06T 7/73 (2017.01);
U.S. Cl.
CPC ...
G06T 7/0002 (2013.01); G01N 35/0099 (2013.01); G06T 7/521 (2017.01); G06T 7/586 (2017.01); G06T 7/73 (2017.01); G06T 2207/10028 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20221 (2013.01); G06T 2207/30204 (2013.01);
Abstract

A method and a device for measuring a physical object, wherein image data of uniquely identifiable points on the object is captured from different perspectives by means of at least one camera, and a spatial position of the uniquely identifiable points are ascertained from this image data, and at least one three-dimensional point cloud of the uniquely identifiable points is created as a global map of the object. To detect a surface quality of the object, light beam bundles are reflected on a surface of the object and are captured as image data. The image data obtained from the light beam bundles reflected on the surface of the object comprises at least some of the uniquely identifiable points as well as surface regions located between the uniquely identifiable points.


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