The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Dec. 21, 2023
Applicant:

Leica Microsystems Cms Gmbh, Wetzlar, DE;

Inventors:

Hideki Sasaki, Wetzlar, DE;

Chi-Chou Huang, Wetzlar, DE;

Shih-Jong James Lee, Wetzlar, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/70 (2024.01);
U.S. Cl.
CPC ...
G06T 5/70 (2024.01); G06T 2207/20081 (2013.01);
Abstract

A system for training a machine-learning algorithm for denoising images is configured to receive training data. The training data includes multiple image sets obtained from one or more series of consecutive images. Each image set includes a plurality of images obtained from a same series of consecutive images. The plurality of images of each image set includes an initial image, a middle image and a last image. The system is further configured to adjust weights of the machine-learning algorithm to obtain a trained machine-learning model, based on an output image of the machine-learning algorithm and a target image. The output image is obtained by using the initial image and the last image as input images. The target image is obtained from the middle image by applying a random shift to the middle image. The system is further configured to provide the trained machine-learning model.


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