The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Mar. 25, 2021
International Business Machines Corporation, Armonk, NY (US);
Regents of the University of Michigan, Ann Arbor, MI (US);
Sohini Upadhyay, Cambridge, MA (US);
Mikhail Yurochkin, Cambridge, MA (US);
Debarghya Mukherjee, Ann Arbor, MI (US);
Yuekai Sun, Ann Arbor, MI (US);
Amanda Ruth Garcia Bower, Melvindale, MI (US);
Seyed Hamid Eftekhari, Ypsilanti, MI (US);
Alexander Vargo, Ann Arbor, MI (US);
Fan Zhang, Fushun, CN;
International Business Machines Corporation, Armonk, NY (US);
University of Michigan, Ann Arbor, MI (US);
Abstract
Obtain a first data set, a second data set, and a machine learning model. Construct a sensitive subspace of the first data set that defines a fair metric for distance among elements of the first data set. Fairly train the machine learning model on the first data set using a distributionally robust optimization approach based on the fair metric. Produce an individually fair set of labels by applying the fairly trained machine learning model to the second data set. Allocate a resource according to the individually fair set of labels.