The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 25, 2025

Filed:

Apr. 07, 2021
Applicant:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Inventors:

Anna E. Csorgo, Budapest, HU;

Balint Magyar, Budapest, HU;

Domonkos Huszar, Kistarcsa, HU;

Mark Szabo, Budapest, HU;

Istvan S. Horvath, Budapest, HU;

Andras Horvath, Budapest, HU;

Csaba Rekeczky, Far Hills, NJ (US);

Assignee:

Verizon Patent and Licensing Inc., Basking Ridge, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 18/214 (2023.01); G06F 18/241 (2023.01); G06V 20/58 (2022.01);
U.S. Cl.
CPC ...
G06F 18/241 (2023.01); G06F 18/214 (2023.01); G06N 20/00 (2019.01); G06V 20/58 (2022.01);
Abstract

Techniques described herein provide for the use of a heterogeneous artificial intelligence/machine learning ('AI/ML') architecture, in which relatively complex AI/ML, techniques may be used in conjunction with more lightweight AI/ML techniques in order to leverage the accuracy of relatively complex AI/ML techniques with the reduced processing power and/or time requirements of more lightweight AI/ML techniques. A teacher model system may utilize processing resource and/or time-intensive AI/ML techniques and/or models in order to determine classifications associated with source data, and may provide such classifications to a student model system that may utilize the classifications in accordance with less processing resource and/or time-intensive AI/ML techniques in order to accurately classify sensor data in real time or near-real time.


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