The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
May. 30, 2024
Oracle International Corporation, Redwood Shores, CA (US);
Antariksha Bhaduri, Karnataka, IN;
Kripa Kanchana Sivakumar, Seattle, WA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A unified schema, such as a common metrics schema, is provided that can universally cater to different kinds of ML metrics generated by different ML pipelines and platforms. In certain implementations, a metrics management system is provided. The metrics management system is based upon the unified schema and provides a repository for storing ML-related metrics in which the metrics may be generated by different disparate pipelines or platforms. The metrics management system may include adapters, converters, layers, libraries, or combinations thereof that can receive metric data and can provide generalized data that can be consumed by various different types of downstream systems. The generalized data may be provided to a downstream system, such as a user interface, an adjustment module, etc.