The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 25, 2025
Filed:
Jun. 30, 2025
Intuit Inc., Mountain View, CA (US);
Linoy Cohen, Petah Tikva, IL;
Udi Menkes, Petah Tikva, IL;
Matan Vetzler, Petah Tikva, IL;
Yakov Gazman, Petah Tikva, IL;
Intuit Inc., Mountain View, CA (US);
Abstract
An alignment score is generated for a test language model from input data including a number of triplet data structures. The method also includes identifying, responsive to the alignment score failing to satisfy a score threshold, a fail triplet data structure in the number of triplet data structures for which the evaluation score includes the indication of fail. A judge language model is executed on the fail triplet data structure to output a type of misalignment that the test language model produced when the test language model executed on the fail prompt. The judge language model is re-executed on a combination of the fail triplet data structure and the type of misalignment to output a cause of the fail response. An enhanced prompt is generated accordingly and then returned.